WXH-820A series microcomputer line protection and measurement device

The WXH-820A product is the latest HELLO series product launched by Xuji. It is a high-quality and cost-effective integrated protection, measurement and control device provided by Xuji based on decades of successful experience in the manufacturing of secondary equipment in power systems. WXH-820A is suitable as a protection and measurement device for power lines with voltage levels of 66 kV and below.

H. The quality of E, L, L, and O is a common feature of Xuji HELLO series products, as follows:

H： High quality includes:

High tech: Adopting on-site configuration technology (FCT) and visual software development technology (VLD).

High quality: Based on professional and mature software and hardware platforms, rich operating experience and fully validated principle algorithms, automatic testing as the premise, advanced R&D management concepts and R&D management tools as the means, to ensure the quality of each link in the R&D, production, and manufacturing processes, and provide users with high-quality products.

E： Easy, easy work includes:

Easy to use: With a user-friendly interface and a Windows like operation menu, it features a debugging guide system and a one click calibration function, making on-site debugging, maintenance, and calibration work easy.

L： Low, low consumption includes:

Low input cost: Different devices share plugins, reducing the cost of purchasing devices and spare parts reserves.

Low failure rate: Advanced detection technology and a comprehensive production quality assurance system greatly reduce product failures and minimize downtime for protected objects.

L： ReaLize, the implementation technology includes:

Platformization: The design of software and hardware adopts the idea of platformization, allowing protection devices of different voltage levels to share hardware platforms, and different hardware platforms to share software, reducing the need for future hardware and software upgrades and maintenance work.

Specialization: Research and development work in different fields is completed by professionals, integrating research and development results from different levels and fields through standardized interfaces, allowing users to fully enjoy high-tech products.

Modularization: Encapsulate all functional modules into flexible relays, and configure different flexible relays for different devices to complete their functions, enabling them to quickly respond to personalized needs of different users.

O： TechOlogy, patented technology includes:

VLD development technology: The VLD development tool is similar to a "PLC" development environment, in which all protection logic is composed of different visualized flexible relays, realizing the industry's dream of developing programs using relay protection languages.

Dual connector technology: Adopting the technology of rear plug-in dual connectors, the principle of complete separation of strong and weak electricity improves the electromagnetic compatibility of the device hardware.

1. Technical indicators

1.1 Rated data

a. Rated power supply voltage: DC220V or DC110V (specify when ordering)

b. Rated communication data:

AC voltage: phase voltage 100/3 V,

The extracted voltage of the circuit is 100/3 V or 100V.

AC current: 5A or 1A (specify when ordering)

Zero sequence current: 1A

Rated frequency: 50Hz

c. Thermal stability:

AC voltage circuit: Long term operation of 1.2Un

AC current circuit: long-term operation for 2In

1s 40In

Zero sequence current circuit: long-term operation 2A

1s 40A

d. Dynamic stability:

Half cycle: 100In

1.2 Device power consumption

a. AC voltage circuit: not exceeding 0.5VA per phase;

b. AC current circuit: When In=5A, each phase should not exceed 1VA, and when In=1A, each phase should not exceed 0.5VA;

c. Zero sequence current circuit: not exceeding 0.5VA per phase;

c. Power circuit: not exceeding 12W during normal operation; When performing protective actions, not exceeding 15W.

1.3 Environmental conditions

a. Environmental temperature:

Work:- 25 ℃ to+55 ℃.

Storage: -25 ℃~+70 ℃, relative humidity not exceeding 80%, indoor environment with no acidic, alkaline or other corrosive or explosive gases in the surrounding air, rain and snow proof; Under the limit value, no excitation is applied, and the device does not undergo irreversible changes. After the temperature is restored, the device should be able to work normally.

b. Relative humidity: The average maximum relative humidity in the wettest month is 90%, and the average minimum temperature in that month is 25 ℃ without condensation on the surface. When the maximum temperature is+40 ℃, the average maximum humidity does not exceed 50%.

c. Atmospheric pressure: 80kPa~110kPa (relative altitude below 2km).

1.4 Anti interference performance

a. Pulse group interference test: able to withstand the pulse group interference test of attenuated oscillating waves with frequencies of 1MHz and 100kHz (the first half wave voltage amplitude is 2.5kV for common mode and 1kV for differential mode) specified in GB/T14598.13-1998.

b. Fast transient interference test: capable of withstanding the harsh level A fast transient interference test specified in Chapter 4 of GB/T14598.10-2007.

c. Radiated electromagnetic field interference test: capable of withstanding the harsh level of radiated electromagnetic field interference test specified in Chapter 4 of GB/T14598.9-2002.

d. Electrostatic discharge test: capable of withstanding the severity level III electrostatic discharge test specified in 4.1 of GB/T14598.14-1998.

e. Electromagnetic emission test: capable of withstanding the conducted emission limits specified in 4.1 and the radiated emission limits specified in 4.2 of GB/T14598.16-2002.

f. Power frequency magnetic field immunity test: capable of withstanding the harsh level IV power frequency magnetic field immunity test specified in Chapter 5 of GB/T17626.8-2006.

g. Pulse magnetic field immunity test: capable of withstanding the severe level IV pulse magnetic field immunity test specified in Chapter 5 of GB/T17626.9-1998.

h. Damping oscillation magnetic field immunity test: capable of withstanding the severe level IV damping oscillation magnetic field immunity test specified in Chapter 5 of GB/T17626.10-1998.

i. Surge immunity test: able to withstand the severe level III surge immunity test specified in Chapter 4 of IEC 60255-22-5:2002.

j. Immunity test for conducted disturbances: able to withstand the conducted disturbances induced by radio frequency fields as specified in Chapter 4 of IEC 60255-22-6:2001.

k. Power frequency immunity test: capable of withstanding the power frequency immunity test specified in Chapter 4 of IEC 60255-22-7:2003.

1.5 Insulation performance

a. Insulation resistance: The insulation resistance value of each charged conductive circuit should not be less than 100M Ω when tested with a testing instrument with an open circuit voltage of 500V between ground (i.e. shell or exposed non charged metal parts), AC circuit and DC circuit, AC current circuit and AC voltage circuit.

b. Dielectric strength: The communication circuit and 24V weak current input and output terminals of the device can withstand AC voltage of 50Hz and 500V (effective value) to ground, and there is no breakdown or flashover phenomenon after a 1-minute inspection; The other charged conductive circuits can withstand AC voltage of 50Hz and 2kV (effective value) between ground (i.e. shell or exposed non charged metal parts), AC circuit and DC circuit, AC current circuit and AC voltage circuit, and have no breakdown or flashover phenomenon after a 1-minute inspection.

c. Impulse voltage: The communication circuit and 24V weak current input and output terminals of the device are grounded and can withstand a standard lightning wave impulse test of 1kV (peak); Each of its charged conductive terminals can withstand a standard lightning wave impulse test of 5kV (peak) between ground, AC circuit and DC circuit, AC current circuit and AC voltage circuit.

1.6 Mechanical Properties

a. Vibration response: The device can withstand the severity level I vibration response test specified in 4.2.1 of GB/T 11287-2000.

b. Shock response: The device can withstand the severity level I shock response test specified in 4.2.1 of GB/T 14537-1993.

c. Vibration durability: The device can withstand the harsh level I vibration durability test specified in 4.2.2 of GB/T 11287-2000.

d. Impact durability: The device can withstand the harsh level I impact durability test specified in 4.2.2 of GB/T 14537-1993.

e. Collision: The device can withstand the severity level I collision test specified in 4.3 of GB/T 14537-1993.