Element Composition Analyzer TDX8800E | Metal Element Analyzer

Product Features

1. Adopting internationally advanced American imported SDD (SILICON DRIFT DETECTOR) silicon drift detector, with higher resolution, greatly improving the detection limit of light elements, and the standard detection limit is tens of times higher than that of SI-PIN detector; The measurement range is wider, covering various conventional material element analysis requirements;

2. Equipped with a US imported data integration processing system, the data collection speed is faster, the measurement is more stable, and the repeatability and long-term stability are better;

3. Configure newly developed specialized measurement software that integrates multiple graphical calculation methods, resulting in more accurate and stable measurement data;

4. The software comprehensively monitors the operating status of the main core components of the instrument, making it safer to use;

5. Configure a specially developed vacuum system for better vacuum performance and better testing results;

Technical parameters:

1. The range of elemental analysis ranges from sodium (Na) to uranium (U)

2. The analysis range of element content is from 1ppm to 99.99%

3. Minimum detection limit: 1ppm

4. Measurement time: 60-200 seconds (adjustable)

5. Instrument working power supply: AC220 ± 5V

6. The energy resolution is 129 ± 5eV

7. Maximum output current of X-ray tube: 1mA

8. Ultimate pressure: 6.7 × 10^-2Pa

9. Sample chamber size: 610 * 320 * 100 (mm) (without vacuum)/Φ 100 * h75 (mm) (vacuum sample chamber)

10. Repeatability of multiple measurements (based on standard samples): ± 0.05% (high content)/± 0.002% (trace amount)

11. Long term work stability (based on standard samples) ±: 0.06% (high content)/± 0.0025% (trace amount)