DeKal Technology (Tianjin) Co., Ltd
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    2-1203 Xinjin International, Xiqing District, Tianjin, China
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Fully automatic material metallographic microscope - Leica DM6 M-research grade
Fully automatic material metallographic microscope - Leica DM6 M-research grade
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迪卡尔科技(天津)有限公司

Advanced fully automatic intelligent digital upright metallographic microscope, suitable for the modular design of observation and analysis of samples such as metals, ceramics, polymer materials, electronic components, dust particles, etc. It can achieve reflection observation and transmission reflection observation configuration

Multi color correction optical path, the overall optical path supports a field of view diameter of 25mm

6-hole electric objective disc, compatible with 32mm diameter industrial objective lens

Built in electric focusing system with an accuracy of 0.015um

Can achieve fully automatic bright field, dark field, polarization, and interference observation methods

The body is equipped with LED transparent and reflective lighting power supply, intelligent light intensity control lighting mode, optional 12V 50W, 10V 100W or EL6000 external light source, which can automatically remember the best light intensity, aperture size and combination of condenser under different objectives and observation modes, automatically restore to place, easy and fast operation, large-sized color LCD display screen displays the working status and parameters of various parts of the microscope, and can touch control the operation of the microscope

The adjustment of light intensity, aperture, observation mode, and spotlight can be controlled not only by buttons, but also by computers

Automatically add corresponding magnification scales to photos taken under different magnification objectives

Equipped with a constant color temperature system to improve work efficiency

Can be equipped with cameras and digital cameras for image acquisition, analysis, and measurement.

Can be equipped with fluorescence observation, high-temperature hot table, cathodoluminescence analyzer, photometer

Can be paired with 4x4, 6x6 large sample stage for observing large-sized samples such as silicon wafers

Can be paired with an automatic scanning table for multi field non-metallic inclusion analysis and particle size and cleanliness analysis


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