FT-391Series Handheld Four Probe Square Resistance Tester Details

FT-391 Series handheld

four-probe resistance tester

Overview:

Refer to the standard for measuring resistivity of silicon wafers (ASTM F84); GB/T 1551-2009 "Method for determination of resistivity of silicon single crystals"; GB/T 1551-1995 "Determination of resistivity of silicon and germanium single crystals using direct current two probe method"; GB/T 1552-1995 "Determination of resistivity of silicon and germanium single crystals by direct current four probe method",

Collecting integrated circuit constant current source system, rechargeable power supply system, upper and lower limit settings

Function Introduction

introduction：

Handheld external structure, suitable for workshop production, quality control sampling, and places where measurements are carried out outside; It is also applicable to small and medium-sized semiconductor material production enterprises	Parameter data:	Specification model	FT-391A
FT-391B	FT-391C	1. Range of sheet resistance for block resistance	10～2.00×102Ω/□
10～2.00×103Ω/□	10～2.00×104Ω/□	2. Range of resistivity	1～2×103Ω-cm
1～2×104Ω-cm	1～2×105Ω-cm	3. Resolution	0.01Ω
0.01Ω	0.01Ω
4. Display the reading	LCD display: resistivity, square resistance, unit conversion, current, voltage, probe shape, probe spacing, thickness LCD: resistivity. sheet resistance. unit conversion. current.
voltage. probe shape. probe spacing. thickness.	5. Test mode
Single electrical measurement	6. Working power supply
5V.1000mA	7. Errors

≤ 4.5% (standard sample result standard)

samples）

8. Choose to buy option	Optional 1. Square probe; Optional 2. Linear probe; Probe spacing; Option 3: Probe spacing of 1mm; 2mm； Three specifications of 3mm; Option 4: Probe Material: Tungsten Carbide Needle; Gold plated phosphor copper hemispherical needle square probe; 2. linear probe; 3.Optional	probe spacing: 1mm； 2mm； 3mm in	three sizes.4.Select probe material: tungsten carbide needle.gilded copper hemispherical
needles.	FT-392 Series hand-held	four-probe tester	Parameter data
Specification model	FT-392A	FT-392B	FT-392C
1. Sheet of block resistance range	resistance	0.1～2.00×102Ω/□	0.1～2.00×103Ω/□
0.1～2.00×104Ω/□	2. Range of resistivity
range	0.01～2×103Ω-cm
0.01～2×104Ω-cm	0.01～2×105Ω-cm
3. Resolution	0.01Ω
0.01Ω	0.01Ω

4. Display the readingLCD display: resistivity, square resistance, unit conversion, current, voltage, probe shape, probe spacing, thickness LCD: resistivity. sheet resistance. unit conversion. current.

voltage. probe shape. probe spacing. thickness

5. Test mode

Single electrical measurement	6. Working power supply	5V.1000mA	7. Errors
≤ 4.5% (standard sample result standard)	samples）	8. Choose to buy option	Optional 1. Square probe; Optional 2. Linear probe; Probe spacing; Option 3: Probe spacing of 1mm; 2mm； Three specifications of 3mm; Option 4: Probe Material: Tungsten Carbide Needle; Gilded phosphor copper hemispherical needle 1. Square probe; 2. linear probe; 3.Optional
probe spacing: 1mm； 2mm； 3mm in	three sizes.4.Select probe material: tungsten carbide needle. gilded copper hemispherical	needles.	FT-393
Series Handheld Block Resistance Tester	FT-393 Series of	hand-held Square resistance tester	technical reference
Specification model	FT-393A
FT-393B	FT-393C
1. Range of sheet resistance for block resistance	0.01～2.00×102Ω/□
0.01～2.00×103Ω/□	0.01～2.00×104Ω/□
2. Range of resistivity	range 0.001～2×103Ω-cm

0.001～2×104Ω-cm0.001～2×105Ω-cm

3. Resolution

0.001Ω

0.001Ω	0.001Ω	4. Display the reading	LCD display: resistivity, square resistance, unit conversion, current, voltage, probe shape, probe spacing, thickness LCD: resistivity. sheet resistance. unit conversion. current.
voltage. probe shape. probe spacing. thickness	5. Test mode	Single electrical measurement	6. Working power supply
5V.1000mA	7. Errors	≤ 4.5% (standard sample result standard)	samples）
8. Choose to buy option	Optional 1. Square probe; Optional 2. Linear probe; Probe spacing; Option 3: Probe spacing of 1mm; 2mm； Three specifications of 3mm; Option 4: Probe Material: Tungsten Carbide Needle; Gilded phosphor copper hemispherical needle 1. Square probe; 2. linear probe;	3.Optional	probe spacing: 1mm； 2mm； 3mm in three sizes.4.Select probe
material: tungsten carbide needle. gilded copper hemispherical needles.	FT-394
Series handheld four probe resistivity tester	FT-394 Series hand-held
four-probe resistivity tester	technical reference
Specification model	FT-394A
FT-394B	FT-394C 1. Sheet resistance of block resistors

0.001～2.00×102Ω/□

0.001～2.00×103Ω/□

0.001～2.00×104Ω/□

2. Resistance range

0.0001～2×103Ω-cm

0.0001～2×104Ω-cm

0.0001～2×105Ω-cm

3. Resolution

0.001Ω

0.001Ω

0.001Ω

4. Display the reading

LCD display: resistivity, square resistance, unit conversion, current, voltage, probe shape, probe spacing, thickness LCD: resistivity. sheet resistance. unit conversion. current.

voltage. probe shape. probe spacing. thickness

5. Test mode

Single electrical measurement

1.6. Working power supply5V.1000mA

7. Error machine uncertainty

errors

≤ 4.5% (standard sample result standard)

samples）

8. Choose to buy option

Optional 1. Square probe; Optional 2. Linear probe; Probe spacing; Option 3: Probe spacing of 1mm; 2mm； Three specifications of 3mm; Option 4: Probe Material: Tungsten Carbide Needle; Gilded phosphor copper hemispherical needle 1. Square probe; 2. linear probe;

3.Optional

probe spacing: 1mm； 2mm； 3mm in three sizes.4.Select probe

material: tungsten carbide needle. gilded copper hemispherical needles.

Widely applicable

used：

1. Cover film; Conductive polymer film, high and low temperature electric heating film; Thermal insulation, conductive window film, conductive (shielding) cloth, decorative film, decorative paper; Metallized labels, alloy foil films; Melting, sintering, sputtering, coating, coating layers, resistive and capacitive touch screen films; Resistance testing of electrode coatings, other semiconductor materials, and thin film materials

2. Silicon block, chip resistivity and diffusion layer, epitaxial layer, ITO conductive foil film, conductive rubber and other materials, block resistance semiconductor materials/wafers, solar cells, electronic components, conductive thin films (ITO conductive film glass, etc.), metal films, conductive paint films, evaporated aluminum films, PCB copper foil films, etc,

3. Thin layer resistance and resistivity of EMI coatings and other substances, conductive paints, conductive pastes, conductive plastics, conductive rubber, conductive films, metal films, etc,

4. Anti static materials, EMI protective materials, conductive fibers, conductive ceramics, etc,

Function Description:

1. Four probe single electric measurement method

2. LCD display, automatic measurement, automatic range, automatic coefficient compensation

3. Integrated circuit system, constant current output

4. Provide two language operation interface options: Chinese or English

Reference standard:

1. The standard for measuring the resistivity of silicon wafers (ASTM F84)

2. GB/T 1551-2009 "Method for determination of resistivity of silicon single crystals"

3. GB/T 1551-1995 "Determination of resistivity of silicon and germanium single crystals using direct current two probe method"

4. GB/T 1552-1995 "Determination of resistivity of silicon and germanium single crystals by direct current four probe method"

Working principle and calculation formula

The calculation and testing principle of the square resistance of thin-layer samples using the four probe method are as follows

：

The layout of the linear four probe test is shown in Figure 8, with adjacent needle distances of S1 S2、S3, According to the principles of physics and electricity:

When the current passes through probes 1 and 4, and probes 2 and 3 test the voltage, the calculation is as follows:

Steps and processes

1. Turn on the power and preheat for 5 minutes

2. Assemble the probe and testing platform

3. Set the required parameters

4. Measure the sample

5. Export data

Advantages description:

1. Automatic range

2. Accurate stability

3. Dual electric combination testing method

4. Standard resistance calibration instrument

5. Simultaneously display resistance, resistivity, and conductivity data

6. Can display 5 digits

7. Chinese and English interface

Partial customer cases

Fujian Wanlong Diamond Tools Co., Ltd

Hangzhou Jingxin Coating Packaging Co., Ltd

Dandong Haihao Electronic Technology Co., Ltd

Hangzhou Jingxin Coating Packaging Co., Ltd

South China University of Technology

Far East Foster New Energy Co., Ltd

South University of Science and Technology of China

Fujian Quanzhou Wanlong Industrial Co., Ltd

Suzhou Huanming Electronic Technology Co., Ltd

1.Shijiazhuang Ordnance InstituteTianjin Yihengda Technology Co., Ltd

2.Nanchang Gongjin Technology Co., Ltd

Wood Forest Co., Ltd

3.Beijing Ruiyi Si Technology Co., Ltd

Zhejiang Napei New Materials Co., Ltd

4.Shenzhen Zhongke Testing Instrument Electronic Technology Co., Ltd

Ningbo Enmai Intelligent Technology Co., Ltd

5.Beijing Huiyuan Weiye Technology Co., Ltd

Zhongshan Guangwei Consumer Equipment Co., Ltd

Chengdu Wancheng Technology Co., Ltd

Hebei Dekai Railway Signal Equipment Co., Ltd

Hainan Lenggang Technology Co., Ltd

Zhejiang Shitai Industrial Co., Ltd

Nanchang Gongjin Technology Co., Ltd

Shanghai Mengjian Industrial Co., Ltd

Beijing Xuedilong Technology Co., Ltd

Yiaopin Imaging Technology Suzhou Co., Ltd

anhui normal university

Guangxi Xinghongyuan Technology Co., Ltd

Zhejiang Lide Product Technology Co., Ltd

Zhuzhou Megmeet Electric Co., Ltd

Jiangyin Zhongxing Optoelectronics Industry Co., Ltd

Jiangsu Yizheng Electronic Tube Co., Ltd

Beijing Sipte Technology Co., Ltd

Dongguan Plastic High Plasticization Technology Co., Ltd

Hezhen New Materials Technology (Shanghai) Co., Ltd

Service Items

Warranty: