Product features:
5-inch, high-resolution capacitive touch screen graphical user interface
0.012% basic measurement accuracy and 6-and-a-half bit resolution
Enhance sensitivity to 20mV and 10nA source/measurement range
Source and trap (4-quadrant) operation
4 "Quickset" modes for quick setup and measurement
• Built in context sensitive front panel assistance
• Input banana head insertion on the front panel; Rear panel tri coaxial input connection
2450 SCPI and TSP Script Programming Modes
2400 SCPI compatible programming mode
Front panel USB port for data/programming/configuration I/O

Application:
Very suitable for current/voltage characteristic analysis and functional testing of various modern electronics and devices today
Nanomaterials and devices: graphene, carbon nanotubes, nanowires, low-power nanostructures
• Semiconductor structures: wafers, thin films • Organic materials and devices: electronic ink, printable electronics
• Energy efficiency and lighting: LED/AMOLED, photovoltaic/solar cells, solar cells
• Discrete and passive components: two pins (resistors, diodes, Zener diodes, LEDs, disk drive heads, sensors) and three pins (small signal bipolar junction transistors (BJTs), field-effect transistors (FETs), etc.)
Material characteristic analysis: resistivity, field effect