Beckman Coulter's new generation LS 13 320 XR will be releasedLaser diffraction particle size analysisUpgraded to a higher level, the PIDS patented technology (patent number: 4953978; 5104221) and optimized 132 detectors ensure higher instrument resolution, more accurate results, and better reproducibility. Not only can you measure particles with a wider range of particle sizes, but you can also detect extremely subtle differences between particle sizes faster. PIDS technology truly achieves 10nm particle size measurement; New dry and wet injection modules, "plug and play", meet different analysis requirements, flexible and convenient; The intuitive software and touch screen design greatly simplify the operation of the instrument, requiring only a few clicks to obtain the desired data. LS 13 320 XR will bring you a new measurement experience!

beckman coulterLaser diffraction particle size analyzerLS 13 320 XR main features:

-Superior to ISO 13 320 technical standard

-Compliant with FDA's 21 CFR Part 11 standard

-There are more detectors, up to 132 independent physical position detectors, corresponding to up to 136 real data channels, which can be clearly detected

Distinguish the differences in scattered light intensity spectra between different granularity levels to ensure that no information is missing, and to quickly and accurately measure the true granularity.

-The patented "X" - shaped logarithmic detector array can accurately record scattered light intensity signals, regardless of single or multiple peaks, with high accuracy

Analyze particle size distribution.

-Fully automatic calculation and analysis function, multi peak automatic detection, no need to guess peak shape in advance, no need to select analysis model, providing objective and reliable analysis

A report.

-Upgraded PIDS technology provides innovative high-resolution nanoparticle analysis capabilities, truly achieving 10nm lower limit peak measurement

Quantity.

-PIDS technology can not only directly detect particles as small as 10 nm, but also directly detect multi peak distributions at the nanoscale.

-The nano analysis function and micro analysis function are combined into one, which is powerful. True 10nm measurement can make it an independent high score

Use a resolution nanoparticle analyzer.

-The new generation solid-state laser light source does not require preheating and has a lifespan of over 70000 hours when turned on.

-Parallel signal acquisition and transmission ensure high signal-to-noise ratio, no time difference, and high throughput of the signal.

-Multi wavelength and polarized light analysis techniques provide high assurance for accurate analysis of particle size distribution over a wide dynamic range.

-Multiple automated sample dispersion systems, "plug and play", can be switched in seconds, efficient and convenient.

-The new generation touch screen is designed with ADAPT analysis software, which is more intuitive to operate without the need for operational experience. The measurement can be completed in three simple steps, and the intuitive and eye-catching navigation wheel only requires one step to achieve data display and export.

-ADAPT software automatically adjusts the measurement results to standard green or red, and manages them as qualified/unqualified, achieving direct quality control.

-The software is equipped with a powerful optical parameter database and an innovative "Zero Time" real-time optical model system, which only takes one second

A new optical model can be established to provide objective and accurate analysis reports.

-The instrument is equipped with a self checking diagnostic function, which displays the measurement status at any time during the testing process.

beckman coulterLaser diffraction particle size analyzerLS 13 320 XR Technical Parameters:

-Particle size range: 10 nanometers to 3500 micrometers (peak)

-Main optical path laser source: solid-state laser connected by fiber optic connection

-Detector: 132 independent physical angle detectors

-Real analysis channels: 136

-Multi wavelength measurement: 475nm, 613nm, 785nm, and 900nm

-Optical theoretical model: full Mie theory; Fraunhofer theory

-Accuracy error: less than+/-0.5%

-Reproducibility error: less than+/-0.5%

*This product is only used for scientific research and not for clinical diagnosis.