BX53M Industrial Upright Microscope

Convenient microscopic observation and operation

Simple and guided microscope operation settings make it easier to adjust and replicate system settings.

functionality

BX53M is designed for industrial microscope inspection and has expanded its functionality to meet the requirements of a wider range of applications and inspection techniques.

Precise optical components

With a long history of producing high-quality optical components, it has excellent image quality whether observed through eyepieces or displays.
Customizability

Modular design allows users to flexibly build systems that meet their specific requirements.

Intuitive microscope control is comfortable and easy to use

Microscopic examination tasks often require a long time to adjust microscope settings, acquire images, and perform necessary measurements to obtain satisfactory reports. Users sometimes need to invest time and money to complete professional microscope training, or only understand a small part of the full functions of the microscope before starting work.

The BX53M simplifies complex microscopic examination tasks through its excellent design and convenient control functions. Users do not need long training to master most of the functions of the microscope. Convenient and comfortable operation also improves the reproducibility of images, minimizing human errors to the greatest extent possible.

Encoding hardware: easy to restore microscope settings

The BX53M adopts a new encoding function that integrates the hardware settings of the microscope with the image analysis software. The observation method, illumination intensity, and objective position are all recorded in the software and/or manual controller. The encoding function enables the microscope settings to be automatically saved with each image, making it easier to restore the settings later and provide document records for reports. Not only does it save the operator's time, but it also minimizes the probability of using incorrect settings to the greatest extent possible. The current observation settings are always clearly displayed on the manual controller and software.

BX53M specification (for reflection and reflection/transmission light combination)

BX53M specification (for infrared observation)

BX53M specification (for polarized observation)

MX63/MX63L Semiconductor/FPD Inspection Microscope

Meet the needs of the electronics industry

functionality

Additional features designed to meet ergonomic and safety requirements in the electronics industry to enhance analytical capabilities

humanization

The concise microscope settings make it easier for users to adjust and recall system configurations.

Advanced imaging technology

Optical components and excellent imaging technology can obtain clear images and complete detection.

modularization

Users can customize the system by selecting modules that are suitable for their application.

Analysis tools

The various observation functions of the MX63 series can generate clear images, allowing users to perform defect detection on samples. The lighting technology and the image acquisition options of Olympus Stream image analysis software provide users with more choices for evaluating samples and archiving test results.
By combining dark field with bright field, fluorescence or polarization observation methods, MIX observation technology can obtain special observation images. MIX observation technology allows users to discover defects that are difficult to observe with traditional microscopes. The circular LED illuminating device used for dark field observation has directional dark field function that can provide segmented illumination in four quadrants. This function can reduce sample halo and help observe the surface texture of the sample.

OLS5100 3D Measurement Laser Microscope

3D measurement laser microscope OLS5100. The OLS5100 provides users with reliable data for quality assurance and process control, while ensuring accuracy and repeatability through intelligent functions, making the process of materials science experiments faster and more efficient.

Intelligent workflow improves detection efficiency

The OLS5100 laser microscope is designed for analysis and materials engineering research, combining excellent measurement accuracy and optical performance with intelligent tools to make the microscope easy to use. In terms of precise measurement of shape and surface roughness at the sub micron level, data can be quickly and effectively obtained, simplifying the workflow for operators.

Stable measurement accuracy

The objective lens is the most important optical component of a microscope, which uses light to image the object for the first time, thus directly affecting the quality of imaging and various optical technical parameters. In actual measurement work, the size of the objective lens required for different detection objects varies.

The Olympus LEXT OLS5100 3D measuring laser microscope's Smart Lens Advisor can select the appropriate objective for surface roughness measurement. The intelligent objective lens selection assistant can score the objective lens according to the application situation through three simple steps, and users can know whether the objective lens they are using is suitable, keeping the measurement results stable and not affected by the operator's skill level.

Faster scanning and higher accuracy

By equipping the LEXT laser specific objective OLS5100 laser microscope for surface morphology characterization, a minimum step height difference of 6 nanometers can be detected, achieving highly accurate measurements. The MEMS scanning galvanometer allows the system to scan the entire surface with high resolution. In order to obtain higher quality images, the 4K scanning mode that can achieve better image quality can be selected. Even for structures as fine as 120nm, clear images can still be obtained. The system optimizes the ratio of scanning speed and data accuracy.

With the help of the PEAK algorithm, the OLS5100 laser microscope can collect data in the range of tens of micrometers within seconds. If you want to obtain faster results, the "skip scan" mode allows the system to measure a step height difference of 1 millimeter in just 20 seconds. The microscope operation is very simple, just click the "start" button to automatically collect 3D data. The intelligent scanning function can automatically optimize imaging settings and minimize human differences caused by different operators.

Data analysis is simple and easy to use

DSX 1000 Optical Digital Microscope

The DSX1000 digital microscope is used to observe and measure various samples, including electronic components and metallic materials. This microscope is easy to use, as long as a sample is placed, a series of operations such as 3D observation, measurement, and automatic report generation can be easily completed.

Meet various observation and analysis needs, and improve the workflow of inspection. The number of lenses has increased to 15, covering magnifications of 20-7000X. Users can also use the six observation methods of the microscope to observe and measure various samples. For example, highlighting the irregularity and contour morphology of the sample surface. The microscope head and stage can be adjusted to a free angle of ± 90 °, allowing for arbitrary observation of various complex shaped samples. In addition, faster 3D image acquisition can be achieved, which is nearly ten times faster than traditional Olympus digital microscopes. Finally, we will calibrate the microscope according to each user's work environment to help users achieve precise and efficient observation and measurement.

Main features:

Magnification range 20-7000X, rotatable stage.

Can quickly switch objectives and six observation modes.

Magnification range 20-7000X, rotatable stage

The DSX1000 digital microscope has added 5 new objectives, bringing the total number of objectives to 15. The magnification range of 20-7000X enables precise observation, while the long working distance objective lens enables observation of irregular samples such as circuit boards and machined parts. The microscope head and stage can both rotate ± 90 °, making it easier to observe and analyze thin samples such as wafers or large samples such as automotive components.

BX53-P Universal Research Grade Professional Olympus Polarizationmicroscope

The vivid image observed by the UIS2 objective lens

Select the desired product from the ACHN-P and UPLFLN-P series of polarized light objective lenses that can achieve minimal optical distortion. The UPLFLN-P series objective lens is a universal objective lens that can be used for differential interference observation and fluorescence observation including ultraviolet excitation, and can cope with various studies and inspections including polarized light observation.
Observing image examples

Excellent operational and optical performance

A microscope body with easy operation and clear observation
The Y-shaped framework pursuing ergonomics provides more comfortable operation and improves observation efficiency. Greatly reduces the fatigue of long-term observation.
The field of view has reached 22, which is 21% wider than the typical microscope with a field of view of 20. In addition, the lighting system uses 12V, 100W bright halogen lamps, which can observe bright and realistic polarized light images.

A stage that supports more efficient observation of polarized light
The rotating stage with a rotating center output mechanism allows the sample to rotate smoothly. In addition, the locking mechanism installed every 45 degrees improves observation efficiency.
The rotating stage is equipped with a compound mechanical stage that can control the subtle movement of the sample.

STM7 Olympus Measurement Microscope

Accurate measurement achieved by integrating optical microscopy and measurement capabilities

Years of experience in microscope development have resulted in excellent observation performance. The STM7 Olympus measuring microscope series adopts the UIS2 infinity correction optical system used in optical microscopes. Therefore, the observed images have high resolution and contrast, and aberrations are also eliminated to ensure high-precision measurement of small details.

Observe at low and high magnification using the same microscope
The STM7 measuring microscope can be used by installing a measuring objective adapter to use the measuring objective, and after replacing it with an objective turntable, the metallographic objective can be used. This means that, STM7 combines metallographic optical system and measuring optical system in one measuring microscope. Through this method, whether measuring large or fine samples, or samples with large surface height differences, the STM7 series can correspond to and assist users in selecting the best observation method.Due to the very long working distance of the measuring objective, there is no need to worry about contact between the objective and the sample when focusing on samples with large surface undulations. In addition, with the low magnification capability of the measuring objective, a larger field of view can be observed at once.

SZX10 Research grade System Stereoscopic Microscope

Reliability and repeatability

An operational unit that can be quickly inspected

Rich product lineup, with the option to choose the desired objective lens

Ergonomic design and speed

Comfortable operating environment based on ergonomics
Based on ergonomics, pursue a comfortable operating environment for operators. The high-performance Olympus eyepiece has an ultra wide market, making it easy to observe 3D images for both short and long periods of time, thus reducing eye fatigue. Observation tubes with adjustable tilt angles of 5-45 ° up and down have been prepared for different height differences among operators.

automation

The SZX10 electric focusing drive makes depth of field extension technology (EFI) digital archiving more efficient and automated. Through this, it is even possible to create simulated 3D images, eliminating the gap between the document and the image seen by the eye through the stereoscope light path. In order to promote automated observation, various tools are provided that can not only perform simple 2D measurements, but also perform complex analyses in an easy-to-use environment.

Diversified lighting units

Rich lineup of reflective lighting products

Equipped with various reflective lighting devices such as circular lighting and coaxial reflective lighting. The most suitable lighting environment can be selected based on the sample and its intended use.

Intelligent digital imaging

Save and analyze digital images
Using SZX10, users will want to record or display digital images of real-time observations of samples. By using a tripod and moving the objective lens in the axial imaging direction, a vertical view of the sample can be obtained. Equipped with an Olympus DP cooled digital camera, a flexible imaging system can be achieved. This is designed for high-resolution images (up to 17.3 million pixels) and viewing real-time high-speed images. The advanced interface can achieve excellent color reproduction and there will be no color deviation when moving samples.

Technical specifications: