Park NX12 strives to be rebuilt to meet the needs of many user devices. Other atomic force microscopy solutions lack the necessary versatility to meet the multiple needs of users in this device, making it difficult to reasonably control equipment costs. However, the Park NX12 is designed to accommodate standard environmental atomic force microscopy imaging, liquid scanning probe microscopy, optical and nano optical imaging, making it one of the flexible atomic force microscopes.
Modular design
Park NX12 is an atomic force microscope platform tailored specifically for the needs of professional electrochemical researchers.
It provides a universal solution for scanning probe microscopy based on chemical and electrochemical properties, as well as the characteristics of media in gases and liquids, and can be used for a wide range of opaque and transparent materials.
Park NX12 is a nanotube based on its extensive visible light projection onto scanning probe microscopy technology, which is highly user-friendly.
Park NX12 has high precision and is an ideal platform for multi-user devices and professional researchers.
Multi functional application
Park NX12 has a wide range of functions, including PinPoint in liquids ™ Using nanomechanics, inverted optical microscopy for locating transparent samples, ion conductivity microscopy for soft sample imaging, and improving the visibility of optical properties of transparent samples.
Outstanding electrochemical testing platform
Electrochemical research on batteries, fuel cells, sensors, and corrosion is a rapidly growing field, and many atomic force microscopes cannot directly meet its specific needs.The humanized design of Park NX12 provides convenience for quick operation, thus achieving the functionality and flexibility required by chemical researchers. This mainly includes:
Multi functional and easy-to-use electrochemical cell
Environmental control options for inert gases and humidity
Compatibility of dual potentiometers
Researchers can utilizeThe Park NX12 platform enables various electrochemical applications:
Scanning electrochemical microscope(SECM)
Scanning electrochemical cell microscope(SECCM)
Electrochemical Atomic Force Microscopy(EC-AFM and Electrochemical Scanning Tunneling Microscopy (EC-STM)
Park NX12 Technical Parameters
Scanner
Z scanner
Flexible guided high thrust scanner
Scanning range :15 µ m (optional 30 µ m)
High signal noise level:30 pm
0.5 kHz bandwidth, rms (typical)
XY scanner
Flexible guidance of closed-loop controlXY scanner
Scanning range : 100 µm × 100 µm
Drive table
Z displacement table travel range: 25 mm (Motorized)
Focus on the travel range of the sample stage : 15 mm (Motorized)
XY displacement table travel range: 10 mm x 10 mm (Motorized)
Sample rack
Sample size :Open space up to 50 mm x 50 mm, thickness up to 20 mm (it is recommended to use SPM mode for sample sizes smaller than 40 x 40 mm)
Sample weight :< 500="">
optics
10x (0.23 N.A.) ultra long working distance lens (1 µ m resolution)
Visual coaxial imaging of sample surface and cantilever
view : 840 × 630 µ m (with 10x objective lens)
CCD5 million pixels. 1.2 million pixels (optional)
Software
SmartScan ™
Specialized software for AFM system control and data acquisition
Quick setting and easy imaging of intelligent mode
Advanced use of manual mode and more precise scanning control
XEI
AFM data analysis software
Electronics
Integrated functions
4-channel digital lock-in amplifier
Elastic coefficient calibration(Hot method, optional)
dataQ Control