Phenom ProHigh Resolution Professional Edition Electron MicroscopeIt is an advanced product in the Feina electron microscope series. The fifth generation Phenom Pro has increased magnification to 150000 times, resolution better than 8 nm, and can quickly obtain high-quality images with rich surface details in 30 seconds. It is currently the world's high-resolution desktop scanning electron microscope, which can be used to measure samples at the sub micron or nanometer scale; The Phenom Pro high-resolution professional version inherits the advantages of the Phenom electron microscope series, such as high resolution, 15 second rapid vacuum pumping, non gold spraying viewing edge, fully automatic operation, 2-3 year filament replacement, and shock resistant design. Click on the electron microscope features to learn more.
Phenom ProHigh Resolution Professional Edition Electron MicroscopeA variety of optional expansion function options are available, such as 3D Roughness Reconstruction, FiberMetric, PoreMetric, ParticleMetric, Auto Image Mapping, remote operation, etc. The software can automatically collect data and process images. For example, the fiber statistical measurement system can automatically identify and measure fiber samples, while the large field of view puzzle automatically collects and generates high-resolution, large field of view panoramic photos of the samples, and so on
In addition, there are various sample cups available for selection, which make sample loading more convenient. There is always a suitable sample cup that can provide * solutions for long axis samples, biomaterials, or other types of materials.
Phenom Pro
| Phenom Pro | Phenom ProX | Phenom XL | |
| Optical amplification | 20 - 135 X | 20 - 135 X | 3 - 16 X |
| Electron optical amplification | 80 - 150,000 X | 80 - 150,000 X | 80 - 100,000 X |
| resolution | Better than 8 nm | Better than 8 nm | Better than 14 nm |
| Digital amplification | Max. 12 X | Max. 12 X | Max. 12 X |
| Optical navigation camera | colorful | colorful | colorful |
| Acceleration voltage | 5 Kv -15 Kv continuously adjustable | 5 Kv -15 Kv continuously adjustable | 5 Kv -20 Kv continuously adjustable |
| Vacuum mode | High resolution mode | High resolution mode | High resolution mode |
| Reduce the mode of charge effect | Reduce the mode of charge effect | Reduce the mode of charge effect | |
| 高真空模式 | |||
| detector | Backscattered electron detector | Backscattered electron detector | Backscattered electron detector |
| Secondary electronic detector (optional) | Secondary electronic detector (optional) | Secondary electronic detector (optional) | |
| sample size | Large diameter 32 mm (Ø) | Large diameter 32 mm (Ø) | Large 100mm X 100mm |
| Can simultaneously load 36 0.5-inch sample tables | |||
| Sample height | Height of 100mm | Height of 100mm | Height 65 mm |
