-Instrument Introduction

The principle of ellipsometry measurement has been proposed for a long time, and corresponding testing methods and equipment are constantly being improved and innovated, making ellipsometry an important testing method and widely used in various fields such as optics, materials, biology, medicine, etc. Measuring the thickness, refractive index, and extinction coefficient of thin film materials is one of the fundamental and important applications of ellipsometry.

-Product Features

·The instrument adopts extinction elliptical polarization method for measurement

·High precision, automatic control

·The light source adopts helium neon laser with high wavelength accuracy

·The instrument is connected to a computer through a USB interface

·The supporting software has multiple processing methods for sampling data, suitable for different needs

·There are two versions of the software: the full version and the student version, which are suitable for teaching requirements

-Experimental content

1. Measure Young's modulus