TT260 Coating Thickness Gauge
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☆ Measurement range: 0-10000
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☆ Operating frequency: 0.01cm/s~19.99cm/s
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☆ Detection accuracy: 0.1um
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☆ Indication error: ± [3% H+1]
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Product Introduction
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TT260 Coating Thickness GaugeIt is a portable measuring instrument that can quickly, non destructively, and accurately measure the thickness of coatings and plating layers. It can be used in both laboratories and engineering sites. By using different probes, various measurement needs can also be met. This instrument can be widely used in manufacturing, metal processing industry, chemical industry, commercial inspection and other testing fields. It is an essential instrument for material protection professionals. This instrument meets the following standards: GB/T 4956-1985 Measurement of thickness of non-magnetic coatings on magnetic metal substrates Magnetic methods GB/T 4957-1985 Measurement of thickness of non-conductive coatings on non-magnetic metal substrates Eddy current methods JB/T 8393-1996 Magnetic and eddy current coating thickness measuring instruments JJG 889-95 "Magnetic resistance thickness gauge" JJG 818-93 "Eddy current thickness gauge"
Functional features:
This instrument adopts two thickness measurement methods, magnetic and eddy current, which can non destructively measure the thickness of non-magnetic coatings (such as zinc, aluminum, chromium, copper, rubber, paint, etc.) on magnetic metal substrates (such as steel, iron, alloy, and hard magnetic steel) and non-conductive coatings (such as rubber, paint, plastic, anodized film, etc.) on non-magnetic metal substrates (such as copper, aluminum, zinc, tin, etc.).
Can use 7 types of probes (F400, F1, F1/90 ° F10、CN02、N1)
● It has two measurement methods: Continuous measurement method and Single measurement method;
● It has two working modes: Direct mode and Group mode (A-B)
There are five statistical measures: Mean, Maximum, Minimum, Number of Tests, and Standard Deviation;
Two methods can be used to calibrate the instrument, and the basic calibration method can be used to correct the system error of the measuring head;
● With storage function: capable of storing 495 measurement values;
● It has a deletion function: it can delete a single suspicious data that appears in the measurement, and also delete all data in the storage area for new measurement;
● Set limit: Automatic alarm for measurement values outside the limit; And a histogram can be used to analyze a batch of measurement values
● Printing function: capable of printing measurement values, statistical values, limits, and histograms;
● It has the function of communicating with a PC: it can transmit measurement values and statistical values to the PC for further processing of data;
● Equipped with power undervoltage indication function;
● There is a buzzing sound during the operation process to prompt;
● Equipped with error prompt function, providing error prompts through screen display or beeping sound;
There are two shutdown modes available: manual shutdown mode and automatic shutdown mode
Technical parameters:
overburden |
Non magnetic coatings such as organic materials (such as paints, coatings, enamel, porcelain enamel, plastics, and anodizing treatments) |
Non magnetic non-ferrous metal coating (such as chromium, zinc, aluminum, copper, tin, silver, etc.) |
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The thickness of the covering layer shall not exceed 100 μ m |
The thickness of the covering layer exceeds 100 μ m |
The thickness of the covering layer shall not exceed 100 μ m |
The thickness of the covering layer exceeds 100 μ m |
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Like iron and steel |
The diameter of the measured area is greater than 30mm |
F400 probe 0-400 μ m |
F1 type probe 0-1250 μ m |
F400 probe 0-400 μ m |
F1 type probe 0-1250 μ m |
The diameter of the measured area is less than 30mm |
F400 probe 0-400 μ m |
F400 probe 0-400 μ m |
F400 probe 0-400 μ m |
F400 probe 0-400 μ m |
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Such as copper, aluminum |
The diameter of the measured area is greater than 5mm |
N1 type probe 0-1250 μ m |
Only used for N1 type probe with chrome plating on copper 0-40 μ m |
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Plastic, printed circuit non-metallic substrate |
The diameter of the measured area is greater than 7mm |
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- |
CN02 probe 10-200 μ m |
Probe type |
Optional, see attached table |
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measuring principle |
Magnetic induction and eddy current |
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measuring range |
Probe decision |
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Low resolution limit |
Probe decision |
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Probe connection method |
Split type wire connection (replaceable) |
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Indication error |
A little calibration (um) |
Probe decision |
Two point calibration (um) |
Probe decision |
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Measurement conditions |
Minimum curvature radius (mm) |
Probe decision |
Diameter of the minimum area of the substrate (mm) |
Probe decision |
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Minimum critical thickness (mm) |
Probe decision |
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Temperature and humidity |
0~40℃ |
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Statistical function |
Mean, Max, Min |
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operation mode |
Direct method and group method (Appl) |
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Measurement method |
Continuous measurement method and Single measurement method |
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Upper and lower limit settings |
have |
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Storage capacity |
495 measurement values |
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Print/Connect Computer |
Comes with a printer/can connect to a computer |
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Shutdown mode |
Manual and automatic |
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Power Supply |
1/2 nickel hydrogen battery 5 × 1.2V |
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External dimensions |
270×86×47mm |
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weight |
530g |
TT260 Coating Thickness Gauge Optional Probe Parameter Table
Probe model |
F400 |
F1 |
F1/90 |
F10 |
N1 |
CN02 |
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working principle |
magnetic induction |
Eddy current |
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Measurement range (um) |
0-400 |
0-1250 |
0-10000 |
0-1250 (chrome plating on copper 0-40um) |
10-200 |
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Low resolution (um) |
0.1 |
0.1 |
10 |
0.1 |
1 |
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Indication error |
A little calibration (um) |
±[3%H+1] |
±[3%H+10] |
±[3%H+1.5] |
±[3%H+1] |
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Two point calibration (um) |
±[(1~3)%H+0.7] |
±[(1~3)%H+1] |
±[(1~3)%H+10] |
±[(1~3)%H+1.5] |
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Measurement conditions |
Minimum curvature radius (mm) |
Convex 1 |
Convex 1.5 |
Flat and straight |
10 |
3 |
Flat and straight |
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Diameter of the minimum area of the substrate (mm) |
ф3 |
ф7 |
ф7 |
ф40 |
ф5 |
ф7 |
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Minimum critical thickness (mm) |
0.2 |
0.5 |
0.5 |
2 |
0.3 |
unlimited |
Basic configuration:
HostPrinter, F-head or N-head, standard sheet set (50um, 100um, 200um, 500um, 1000um), iron or aluminum substrate, charger
Optional attachments:
Probe (F400, F1, F1/90 ° F10、CN02、N1)、 Communication cables, communication software