X-ray crystal flaw detectorMainly used for studying the internal microstructure of materials. For example, single crystal orientation, defect inspection, material characterization, determination of lattice parameters, determination of residual stress, etc.

X-ray crystal flaw detectorTechnical parameters:

1Tube voltage:10～60KVAutomatically controlled by a microcontroller(1KV/step)；

2Tube current:5～80mAAutomatically controlled by a microcontroller(1mA/step)Stability of tube voltage and tube current ≤0.3‰

3Rated output power:3KW

Whether there is pressure, no current, overvoltage, overcurrent, over power, no waterXLight tube over temperature protection.

4Cooling device:

Equipped with a built-in refrigeration system, there is no need for external water circulation, and the water temperature and display are automatically controlledXLight tube temperature.

5Protective cover: The external radiation measurement shall not exceed2.5μSv/h

6、XLight tube: rated power2KW(Copper target)

7Timing: The microcontroller automatically sets the timing, allowing for arbitrary selection of the timing time.