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X-ray fluorescence coating thickness measuring instrument FT160
▶ PCB、 Semiconductor and electronics industry specific (1) PCB/PWB surface treatment: The ability to control the surface treatment process determines
Product details
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FT160 is a micro focal spot analysis instrument for microelectronic devices. This timeless instrument is designed specifically for micro focal spot and thin coating analysis, and can meet the challenges of the increasingly miniaturized electronics industry and PCB board coatings.
FT160 can provide:
1. Capillary focusing optical components and high-sensitivity SDD detector.
2. Measurement of samples smaller than 50 μ m
3. * * Performance to meet the challenges of semiconductor chip technology.
4. Quickly obtain results, easy to use, to improve productivity.
5. A wide sample compartment door and sample stage to accelerate sample presentation speed.
6. A wide sample observation window for testing and monitoring.
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project describe X-ray irradiation direction Upper illumination type Measurement elements Al (13) ~ U(92) Target material Tungsten (W) target, molybdenum (Mo) target Measurement environment atmosphere X-ray generator 45kV, molybdenum Mo target material design Capillary focusing on Poly capillary tube current *Up to 1000 μ A variable X-ray Inspection Department Silicon Drift Detector (SDD) Measure area φ0.030mm(FWHM 0.017mm) *Large sample area FT160 length 400mm x width 300mm x height 100mm
FT160L 600mm x 600mm special editionElectric XY sample stage driving range 400×300mm CCD Camera High quality camera with 16x zoom capability Focus Mode Laser autofocus Measurement mode Thin Film FP (5 layers, 10 elements)/Measurement Line Method
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