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X-ray fluorescence coating thickness measuring instrument FT230
The design of the FT230 desktop XRF analyzer greatly reduces the measurement time. Hitachi engineers believe that setting up samples and selecting mea
Product details
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Each part of FT230 is designed for accurate testing and significantly reduces analysis time.
- Automatic focusing reduces sample loading time
- Find My Part ™ Automatically perform intelligent recognition to set up a complete measurement program
- Most of the screen area is used to display the sample view, providing * * visibility
- The self checking diagnostic program ensures the condition and stability of the instrument
- Seamless integration with other software enables it to easily export data
- Adopting a new user interface, non professionals can also use it intuitively and conveniently.
- Powerful function, capable of measuring four layers of coatings simultaneously
- Durable and long-lasting in challenging production or laboratory environments
- Complies with ASTM B568 and DIN ISO 3497 standards
- Assist you in meeting the specifications of ENIG (IPC-4552B), ENEPIG (IPC-4556), Immersion Tin (IPC-4554), and Immersion Silver (IPC-4553A)
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analysis details X-RAY TUBE Tungsten (W) target microfocus X-ray tube, from top to bottom irradiation type, * 50 kV, 1000 μ A, 50 W detector High resolution large area 50 mm2 SDD Primary filter 5 primary filters (2 types of aluminum film, titanium film, molybdenum film, nickel film)+1 unfiltered filter collimator 4 collimators, available in both oval and circular shapes, with a size range from 0.01 x 0.25 mm to 1 mm (0.5 x 10 mil to 40 mil) Element Range Aluminum (13) - Uranium (92) Number of layers *5 more layers (4 layers plus substrate) Optional elements Free choice Atmospheric compensation Automatic temperature and pressure compensation environment air standard The energy dispersive X-ray fluorescence measurement coating complies with ASTM B568 DIN ISO 3497 Sample positioning details *Large sample size 500 x 400 x 150 mm Sample table itinerary 250 x 200 mm Sample table size 900 x 600 mm - Electric sample stage, slotted sample chamber
270 x 210 mm - Electric sample stage, enclosed sample chamber
540 x 540 mm - Fixed Sample StandSample table speed (electric configuration) 80mm/s Sample stage accuracy (electric configuration) ≤ 5 μm *Large sample weight 10 kg - Fixed Sample Stand
5 kg - Electric Sample StandZ-axis travel 205 mm work distance 5 mm nominal, focused laser
5 to 67 mm - autofocus/auto approach (optional)Sample Stand - Z-axis Control Software control and three-way joystick with start button (optional) focus 7.1 x 5.3 mm Field of view (wide-angle camera, optional) 250 x 200mm Positioning assistance Laser positioning, pre positioning laser (electric sample stage configuration) software details user interface FT Connect standard function Coating analysis (FP and empirical analysis), bulk material composition analysis (FP and empirical analysis), multi-point programming, qualitative mode, data history, diagnosis, ExTOPE cloud link password protection, multi-level access control software Intelligent recognition function Find My Parts "(machine vision, QR code/barcode scanning, text search)," Find My Mode "(machine vision) language Simplified Chinese, Traditional Chinese, Czech, English, French, German, Italian, Japanese, Korean, Portuguese, Russian, Spanish PC specifications Windows 10 64 bit PC Size and working environment details size 600 x 815 x 745 mm - Closed sample chamber
900 x 931 x 745 mm - slotted sample chamber, electric sample stageWeight (excluding PC) 140kg temperature range 10 - 40 °C Humidity range *High relative humidity: 90% (no condensation) Power supply requirements 100-240 V±10% ; 47-63 Hz ; 1.5 A Signal tower (optional) Three layer red/yellow/green indicator lights (X-ray open/shutter open/instrument powered on) Typical Properties of Au/NiP/Cu Au NiP Range 0.051 - 0.09 μm
(2.00 - 3.55 μin)2.7 - 5.7 μm
(106 - 225 μin)Standard Error 0.025 μ m (1 μ in) or 5% relative deviation, whichever is greater 0.025 μ m (1 μ in) or 5% relative deviation, whichever is greater Accuracy at 30 seconds (2 σ), 0.3 mm collimator 0.0025 μm @ 0.09 μm
(0.099 μin @ 3.55 μin)0.026 μm @ 5.7 μm，8 %P
(1.02 μin @ 225 μin，8 %P)Typical Properties of Sn/Ni/Cu Sn Ni Range 2.16 - 9.2 μm
(85 - 362 μin)0.97 - 15.1 μm
(38 - 595 μin)Standard Error 0.025 μ m (1 μ in) or 5% relative deviation, whichever is greater 0.025 μ m (1 μ in) or 5% relative deviation, whichever is greater Accuracy at 30 seconds (2 σ), 0.3 mm collimator 0.014 μm @ 4.9 μm
(0.55 μin @ 193 μin)0.036 μm @ 4.7 μm
(1.42 μin @ 185 μin)
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