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X-ray fluorescence coating thickness measuring instrument
X-ray fluorescence coating thickness measuring instrument
Product details

  • Coating thickness and material analysis based on X-ray fluorescence is a widely accepted and recognized analytical method in the industry, providing easy-to-use, fast, and non-destructive analysis that requires almost no sample preparation and can analyze elements from the periodic table13Al to92Solid or liquid samples of U. The X-Strata 920 offers multiple configurations for analyzing single-layer and multi-layer coatings (including alloy layers). There are four types of sample table configurations, namely standard table, well depth type, widened type, and programmable type, which can analyze component samples of any shape according to requirements.
    1. The slotted sample chamber design can measure large flat samples, such as printed circuit boards larger than the instrument width or small connectors and plug-in samples. All samples can be conveniently placed and positioned at the testing point
    2. Sample size: 270 x 500 x 150mm
    3. Collimator: 0.01mm x 0.25mm (0.5 x10 mil)
    4. Detector proportional counter (Ti titanium~- U uranium) or high-resolution (Al aluminum-U uranium) SDD can be selected according to requirements
    5. It is possible to analyze the thickness and composition of metal films, as well as the electroplating and chemical coating of typical elements ranging from atomic numbers 22 to 92
    6. Multi layer multi-element correction complies with IPC 4556, IPC 4552A
    7. Z-axis automatic control, Z-axis autofocus system
    8. Cobalt secondary filter, used for accurate correction of mutual interference between copper and nickel, suitable for * * measurement of nickel layer
    9. Number of collimators: 6
    10. The thickness of the metal film ranges from 0.03 micrometers (30nm) to 30 micrometers, depending on the different coating elements and coating structures
    11. Hitachi SmartLink FP Basic Parameter Method

    project describe
    Measurement direction
    (Direction of X-ray irradiation)
    From top to bottom, even if there is a certain amplitude or unevenness on the surface of the sample, it can be easily focused
    External dimensions Width x Depth x Height [mm]: Approximately 407 x 770 x 400 mm
    Sample stage design Slotted sample chamber can measure large flat samples, such as printed circuit boards larger than the instrument width or small connectors, and connect external program samples. All samples can be easily placed and positioned at the testing point. Z-axis automatic control (Z-axis stroke: 43mm)
    Internal dimensions of sample chamber: 236 x 430 x 160mm (width x depth x height)
    X-ray source W-target ray tube
    High voltage generator 50 kV, 1.0 mA (50 W) high voltage generator, adjustable high voltage multiple levels
    Secondary filter Cobalt secondary filter, used for accurate correction of mutual interference between copper and nickel, suitable for precise measurement of nickel layers.
    X-ray receiver inspection (detector) Proportional counter (Ti titanium~- U uranium) or high-resolution (Al aluminum-U uranium) SDD
    Element Range Titanium uranium, or aluminum uranium (SDD)
    Video system Color CCD, 30x optical magnification, 200%, 300%, and 400% digital magnification. Sample analysis area
    Displayed in the user interface, clear and user-friendly.
    Z-axis autofocus system Laser is used for automatic and precise positioning of X-ray tubes/detectors along the Z-axis to the optimal testing distance of the tested sample.
    One click operation "moves the Z-axis test head to the optimal position and simultaneously focuses the sample image (displayed on the screen).
    Automatic and simple operation improves the reproducibility of instrument testing and reduces human measurement errors to a minimum.
    Note: The optimal testing distance is 12.7mm, and the height (Z-axis) is automatically adjusted by the X-ray testing head.
    Measurable coating
    Element Range
    The elements from titanium 22 to uranium 92 in the periodic table
    Measurable number of coating layers *Multiple layers can be measured simultaneously (excluding substrate)
    Measurable coating thickness range Usually around 0.03 microns to 30 microns, depending on the different coating elements and coating structures.



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