The principle of X-ray thickness gauge is to convert and measure the thickness based on the intensity attenuation when X-rays penetrate the measured object, that is, to measure the amount of X-rays absorbed by the measured steel plate, and determine the thickness of the measured object based on the energy value of the X-rays. The received signal is converted into an electrical signal by the X-ray detection head, amplified by a preamplifier, and then converted into an intuitive actual thickness signal for display by a dedicated thickness gauge operating system.

X-ray XUL：

X-ray XULM：

X-ray XAN 220/222:

X-ray XAN 250/252：

X-ray XDLM:

X-ray XDAL:

X-ray XDV SDD:

X-ray XDV-µ:

Characteristics of XDV-u Coating Thickness Measuring Instrument

• Optimized micro area analysis testing instrument
• According to the X-ray optical system, structures of 100 μ m or smaller can be analyzed
• Extremely high energy intensity, achieving excellent accuracy
• Even for thin coatings, the measurement uncertainty may reach<1 nm
• Only applicable to flat or nearly flat samples
• Large capacity measurement cabin with bottom C-shaped slot
• Automatic measurement through a fast and programmable XY workbench

Typical application areas of XDV-u coating thickness measuring instrument

• Measure the coating system on printed circuit boards, lead frames, and chips
• Measure the coating system on small components and thin wires
• Analyze the material composition of microstructures and small components

X-ray XUV 733：

X-ray 4000：

X-ray 5000：

characteristic

• Flange measuring head, used for continuous measurement in production lines
• X-ray detectors can be proportional counter tubes, Peltier cooled silicon PIN or silicon drift detectors
• Directly use typical products for quick and simple calibration during the production process
• Can be used in vacuum or atmosphere
• Measurements can be taken on high-temperature substrates up to 500 ° C
• Sturdiness and durability are the focus of design

Typical application areas

• Photovoltaic technology (CIGS, CIS, CdTe)
• Analyze the coatings on metal strips, metal films, and plastic films
• Continuous production line
• Monitoring of Spray and Electroplating Production Lines
• Measure large-area samples

characteristic

• Used for continuous measurement of coating layers on thin films, shaft belts, and stamping belts during continuous production processes
• The angle of the measuring head can be adjusted correctly according to the direction of sample movement
• Easy to operate, short setup time
• X-ray detectors can be proportional counter tubes, Peltier cooled silicon PIN or silicon drift detectors
• There is a positioning device used to measure multiple positions for measurement
• Specially designed according to customer needs
• Automatic calibration
• Can quickly transfer from one production line to another
• Can be easily integrated into quality control systems and process control systems

Typical application areas

• Electroplating strips, such as contact points and stamping strips
• Measure hot-dip galvanized steel strip
• Solar thin-film cells (photovoltaic industry)
• Metal coatings on films and strips
• Electronic industry and its suppliers
• Production process monitoring

characteristic

• Universal advanced instruments that can meet various measurement needs
• The measurement chamber can be evacuated and can analyze light elements starting from Z=11 (Na)
• Accurate and programmable XYZ workbench for automatic measurement
• Camera is used for precise positioning of samples and measurement on small parts

Typical application areas

• Measurement and analysis of light elements
• Thin coating measurement and trace analysis
• General material analysis and identification
• Non destructive analysis of precious gemstones
• photovoltaic industry

Instrument characteristics

• Advanced model instrument with all common functions
• The flexibility of radiation excitation is the greatest, and the excitation can be changed according to the size of the measurement area and the composition of the spectrum
• Through silicon drift detectors, it can also operate normally at ultra-high signal quantities of>100000 CPS (count rate per second) without a decrease in energy resolution
• Extremely low detection limit and excellent measurement repeatability
• Automatic measuring instrument with fast, programmable XY worktable
• Large capacity and easy to operate measurement cabin

Typical application areas

• Measuring extremely thin coatings, such as those used in the electronics and semiconductor industries
• Trace analysis, such as detecting harmful substances according to RoHS, toy standards, and packaging standards
• Perform high-precision analysis of gold and precious metals
• photovoltaic industry
• Measure the thickness and composition of NiP coating

characteristic

• Equipped with semiconductor detectors, it can perform element analysis and thin coating measurement more accurately due to its better signal-to-noise ratio
• The use of micro focusing tubes can measure smaller measurement points, but due to their low signal intensity, they are not suitable for measuring very small structures
• Large capacity measurement cabin with bottom C-shaped slot
• Fast and programmable XY platform with pop-up function

Typical application areas

• Material analysis of coatings and alloys (also applicable to thin coatings and low content components)
• Incoming inspection, production monitoring
• research and development
• electronic industry
• Connectors and contacts
• Gold, jewelry, and watch industries
• Can measure nanometer thin coatings, such as Au and Pd coatings on printed circuit boards and electronic components
• trace element analysis
• Determining lead (Pb) content in applications with high reliability requirements
• Analysis of Hard Coating

Characteristics of XDLM Coating Thickness Measuring Instrument

• Extremely versatile, equipped with micro focusing tubes, 4 switchable collimators, and 3 basic filters
• Suitable for small structures such as connectors or circuit boards
• Also suitable for long-distance measurement (DCM method, range 0-80 mm)
• Large capacity measurement cabin with bottom C-shaped slot
• Programmable desktop device for automatic measurement

Typical application areas of XDLM coating thickness measuring instrument

• Measure thin gold, palladium, and nickel coatings in the printed circuit board industry.Nickel layer thickness measurement、Nickel thickness

• Measure the coating of connectors and contacts.

• Measure functional coatings in the electronics and semiconductor industries.

• The gold, jewelry, and watch industries.

characteristic

• High performance models with powerful comprehensive measurement capabilities
• Equipped with 4 electrically adjustable collimators and 6 electrically adjustable basic filters
• Equipped with high-resolution silicon drift detector (SDD), it is also suitable for more complex multi-element analysis
• The measurement direction from bottom to top can easily achieve sample positioning

Typical application areas

• Measurement of functional coatings with only a few nanometers in the electronics and semiconductor industries
• Trace analysis of harmful substances, such as lead content in toys
• High precision analysis of alloys in the jewelry and watch industry, as well as in the field of metal refining
• Used for university research and industrial R&D fields

X-ray XDL:

Characteristics of XDL Coating Thickness Measuring Instrument

• Durable and sturdy coating thickness measurement equipment, capable of measuring even at larger distances (DCM function, range 0-80 mm)
• Fixed aperture and fixed filter
• Used for measuring points starting from 1mm in size
• Large capacity measurement cabin with bottom C-shaped slot
• Programmable desktop device for automatic measurement
• Standard X-ray tube, proportional counter

Typical application areas of XDL coating thickness measuring instrument

• Measurement of electroplated parts produced on a large scale
• Anti corrosion coatings and decorative coatings, such as chromium on nickel/copper.Chromium layer thickness measurement、Copper thickness measurement
• Analysis of Electroplating Solution in Electroplating Industry
• Gold, jewelry, and watch industries

characteristic

• Specially optimized design for non-destructive analysis of jewelry, coins, and precious metals
• Equipped with fixed collimators and basic filters, especially suitable for precious metal analysis
• Equipped with high-resolution silicon drift detector (SDD), suitable for more complex multi-element analysis
• The measurement direction from bottom to top can achieve sample positioning most conveniently

Typical application areas

• Analysis of Gold and Precious Metals in the Jewelry and Watch Industry
• Analysis of Materials and Alloys in the Dental Industry

Characteristics of XULM Coating Thickness Measuring Instrument

• Widely used coating thickness measuring instruments, includingThickness measurement of gold layer、Silver layer thickness measurementandGold thicknessWait.
• By combining optional high voltage and filters, the same effect can be measured on thinner coatings (such as 50 nm Au or 100 μ m Sn) and thicker coatings
• Equipped with a micro focusing tube, it can measure tiny measurement points with a size of 100 μ m.
• Proportional counters can achieve high counting rates of thousands of CPS (counting rate per second).
• The direction of the radiation from bottom to top allows for quick and easy placement of samples.
• A large capacity measurement chamber with a C-shaped groove at the bottom.

Typical application areas of XULM coating thickness measuring instrument

• Measurement of coatings in Au/Ni/Cu/PCB or Sn/Cu/PCB in the circuit board industry
• Coatings on connectors and contacts in the electronics industry
• Decorative coating Cr/Ni/Cu/ABS
• Electroplated coatings, such as the anti-corrosion protective layer Zn/Fe on mass-produced parts (bolts and nuts), ZnNi/Fe
• Jewelry and watch industry.
• Measure the metal content in the plating solution, such asThickness measurement of gold layer、Silver layer thickness measurement.

characteristic

• Used for measuring coating thickness in the electroplating industry.
• Fixed collimator and fixed basic filter.
• The X-ray tube is equipped with a slightly larger main light spot, suitable for measuring points of about 1 mm or more.
• Low energy beams produce fewer rays, however, there will be no problem with measuring traditional electroplating layers such as chromium, nickel, copper, etc.
• The direction of the radiation from bottom to top allows for quick and easy placement of samples.
• A large capacity measurement chamber with a C-shaped groove at the bottom.
• Standard X-ray tube, proportional counter

Typical application areas

• Measurement of coatings in Au/Ni/Cu/PCB or Sn/Cu/PCB in the circuit board industry
• Coatings on connectors and contacts in the electronics industry
• Decorative coating Cr/Ni/Cu/ABS
• Electroplated coatings, such as the anti-corrosion protective layer Zn/Fe on mass-produced parts (bolts and nuts), ZnNi/Fe
• Jewelry and Watch Industry
• Measure the content of metal components in electroplating solution