-Instrument Introduction

The electronic speckle pattern interferometry (ESPI) experimental system uses speckle patterns, the carrier of rough surface information, to study object out of plane deformation. It is a modern optical measurement technology that combines computer image processing technology, laser technology, and holographic interferometry technology. The high coherence of laser makes speckle phenomenon obvious, and CCD camera is used to enable computer processing of data and images. Electronic speckle pattern interferometry has a wide range of applications, such as deformation measurement, non-destructive measurement, vibration measurement, etc.

-Product Features

·Simple structure, high precision, non-contact, good sensitivity, fast information processing, no need for darkroom operation, real-time display of the entire field information