XRF Coating Thickness Gauge FT230-Fornitore globale

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XRF Coating Thickness Gauge FT230

The design of the FT230 desktop XRF analyzer greatly reduces the measurement time. Hitachi engineers realized that setting up samples and selecting measurement formulas often take a lot of time, so they introduced a groundbreaking analyzer that can effectively "set up" itself, allowing for the analysis of more parts during the process.

Automation and innovative software are the characteristics of the FT230 analyzer. Intelligent recognition module, such as Find My Part ™ (Search for my samples) means that the operator only needs to load the samples, confirm the parts, and FT230 will handle the rest. It will find the correct measurement position on your component - even on large substrates - select the correct analysis program and send the results to your quality system. Reducing time and human errors allows you to complete more analysis in a shorter amount of time, making inspections more realistic in busy production environments.

XRF Coating Thickness Gauge FT230 Product Highlights:

Each part of FT230 is designed to significantly reduce analysis time.

Automatic focusing reduces sample loading time

Find My Part ™ Automatically perform intelligent recognition to set up a complete measurement program

Most of the screen area is used to display the sample view, providing visibility

The self checking diagnostic program ensures the condition and stability of the instrument

Seamless integration with other software enables it to easily export data

Due to the adoption of a new user interface, non professionals can also use it intuitively and conveniently.

Powerful function, capable of simultaneously measuring four layers of coatings and analyzing substrates

Durable and long-lasting in challenging production or laboratory environments

Complies with ASTM B568 and DIN ISO 3497 standards

Assist you in meeting the specifications of ENIG (IPC-4552B), ENEPIG (IPC-4556), Immersion Tin (IPC-4554), and Immersion Silver (IPC-4553A)

Technical specifications of FT230 desktop XRF analyzer:

analysis	in detail
X-RAY TUBE	Tungsten (W) target microfocus X-ray tube, from top to bottom irradiation type Larger 50 kV, 1000 µ A, 50 W
detector	High resolution, large area 50 mm2 SDD
Primary filter	5 primary filters (2 types of aluminum film, titanium film, molybdenum film, nickel film)+1 unfiltered position
collimator	4 collimators, available in both oval and circular shapes, with a size range from 0.01 x 0.25 mm to 1 mm (0.5 x 10 mil to 40 mil)
Element Range	Aluminum (13) - Uranium (92)
Number of layers	Up to 5 layers (4 layers plus substrate)
Optional elements	Free choice
Atmospheric compensation	Automatic temperature and pressure compensation
standard	The energy dispersive X-ray fluorescence measurement coating complies with ASTM B568 DIN ISO 3497

Analyze in detail