Zeiss Xradia 510 Versa is a 3D sub micron imaging system with breakthrough flexibility

Use this X-ray microscope to break down the barrier of 1 micron resolution for 3D imaging and in situ/4D research.

Combining resolution and contrast with flexible working distance can expand non-destructive imaging capabilities in the laboratory.

Thanks to its two-stage amplification technology structure, it can achieve sub micron resolution at long distances (RaaD). Reduce dependence on geometric magnification and maintain sub micron resolution even at larger working distances.

Even at a large working distance from the light source (from millimeters to centimeters), versatility can still be enjoyed.

3D imaging of soft or low-Z materials through advanced absorption capability and innovative phase contrast

Achieving world leading resolution at flexible working distances beyond the limitations of projection based micro CT

Addressing sub micron level features to accommodate various sample sizes

Expand non-destructive imaging in the laboratory using in-situ/4D solutions

Investigate materials in the environment similar to this machine over time

Throughput of image quality

　　Zeiss Advanced Reconstruction ToolboxBetter image quality, higher throughput

Advanced Reconstruction Toolbox is an innovative platform on the Zeiss Xradia 3D X-ray microscope that provides access to advanced reconstruction techniques. The unique module fully utilizes a profound understanding of X-ray physics principles and customer applications to solve the most challenging imaging challenges in a novel way.

You can find information about the latest technological advancements in X-ray microscopy here:

Using the Advanced Reconstruction Toolbox, you can:

Improve data collection and analysis for accurate and rapid decision-making

Greatly improve image quality

Achieve excellent internal tomography or flux on multiple samples

Revealing subtle differences by improving contrast

For sample categories that require repetitive workflows, increase the speed by an order of magnitude

　　Using AI to Advance Reconstruction Technology for Supercharging 3D X-ray Imaging

One of the main challenges in using X-ray microscopes to solve academic and industrial problems is to strike a balance between imaging flux and image quality. The acquisition time of high-resolution 3D X-ray microscopy may be on the order of several hours, which can lead to extremely challenging return on investment (ROI) calculations when weighing the relative advantages of high-precision 3D analysis using inexpensive and poorly performing analysis techniques.

To address this issue, it is necessary to optimize each step of generating actionable information from these microscopes. For 3D X-ray tomography, these steps typically include sample installation, scan setup, 2D projection image acquisition, 2D to 3D image reconstruction, image post-processing and segmentation, and final analysis.

　　The imaging flux of Zeiss DeepRecon replicated samples is 10 times faster

ZEISS DeepRecon for ZEISS Xradia XRM is the first commercially available deep learning reconstruction technique. It allows you to increase throughput by an order of magnitude (up to 10 times) without sacrificing novel XRM long-range resolution for repetitive workflow applications. DeepRecon uniquely collects hidden opportunities in big data generated by XRM and provides significant speed or image quality improvements driven by AI.