1、 Instrument usage
The ZYJ-2000 series metallographic microscope is mainly used for identifying and analyzing the internal structure and organization of metals. It is an important instrument for studying metallurgy and a key equipment for identifying product quality in industrial sectors. It is mainly used to identify and analyze the microstructure of various metals and alloys. It is applied in factories or laboratories for casting quality identification, raw material inspection, or research and analysis of metallographic structure after material treatment. This series of products adopts high-performance infinite distance optical systems, simple operation, innovative technology, complete functions, good stability, which can meet your various application needs now and in the future, and can be flexibly upgraded.
2、 System Introduction
This system can be conveniently observed in real-time on a computer (digital camera) display screen, and can edit, save, and print the required images.
3、 Technical parameters
Project Name: Technical Parameters and Indicators
Optical System: Infinite Distance Optical System
Large field of view eyepiece: EW10 ×/22
EW10 ×/20, cross reticle eyepiece
Infinite long working distance flat field achromatic objective lens (bright and dark fields) 5 ×/0.12/∞/- (BF/DF) LWD 10mm
10×/0.25/∞/-(BF/DF) LWD 10mm
20×/0.4/∞/0(BF/DF) LWD 5mm
50×/0.75/∞/0(BF/DF) LWD 1.3mm
100×/0.9/∞/0(BF/DF) LWD 0.7mm
Observation head: hinged binocular observation head, tilted at 30 °, pupillary distance: 48-75mm
Kohler Lighting: 12V/50W halogen lamp, center and brightness continuously adjustable
Built in polarizer and analyzer, green, blue, yellow, gray color filters and frosted glass
Focusing system: Coarse and micro coaxial focusing, fine adjustment grid value of 2 μ m, coarse adjustment of elasticity, movement range up 1mm, down 7mm
Converter: Backward quintuple nosepiece inward five hole converter
Stage: Rectangular double-layer movable platform 226 × 178mm, with a moving range of 40mm × 40mm
Small platform: Φ 16, Φ 40, droplet shaped
Objective micrometer, lamp chamber calibration material
High pixel digital imaging system