Zeiss X-ray microscope VersaXRM 730

Excellent tomography, constantly meeting the diverse needs of every user and various samples, exploring the infinite potential of the Zeiss VersaXRM 730, and enjoying its unique 40 × - Prime objective and award-winning ZEN navx. With outstanding image resolution performance, this system redefines sub micron imaging and brings new breakthrough features to your research. ZEN navx utilizes the insights of intelligent systems to simplify workflows and ensure easy and efficient retrieval of results. Artificial intelligence based reconstruction provides excellent image quality, DeepRecon Pro effectively improves throughput, and FAST mode can achieve tomography within one minute. Embark on a new era of exploring samples with the Zeiss VersaXRM 730.

　　Innovate your research with outstanding resolution performance

Zeiss 40 × - Prime objective lens

The Zeiss VersaXRM 730 is equipped with a unique 40 × - Prime objective lens, which helps you achieve excellent image resolution performance of 450-500 nm within the full source voltage range of 30 kV to 160 kV. This feature has unlocked new application functionalities for researchers, driving the development of industry standards for sub micron imaging resolution. In addition, with the increase of X-ray photons, various sample results can be obtained faster without affecting resolution. Zeiss VersaXRM for achieving high working distance and high resolution (RaaD) ™) Renowned for its functionality, it has always been able to perform high-resolution imaging of multiple sample types and sizes over a long scale range. With the VersaXRM 730's distinctive 40 x Prime objective and higher energy, you will now experience sub micron imaging beyond the past.

　　High quality images based on artificial intelligence

The Zeiss DeepRecon Pro in the Advanced Refactoring Toolbox has become a powerful tool for XRM refactoring, therefore the VersaXRM 730 includes the ART high-performance workstation and DeepRecon Pro (licensed for two years).

DeepRecon Pro is an innovative technology based on artificial intelligence that can bring excellent efficiency and image quality advantages to various applications. DeepRecon Pro is suitable for both individual samples and semi repetitive and repetitive workflows. Users can now independently train brand new machine learning network models on-site through a user-friendly interface. DeepRecon Pro's one click workflow allows novice users to operate proficiently without the assistance of experts familiar with machine learning technology.

　　Revealing crystal structure information

　　LabDCT Pro for Diffraction Contrast Tomography (DCT)

The LabDCT Pro for Diffraction Contrast Tomography (DCT) is only available for the Zeiss VersaXRM 730 and can achieve non-destructive 3D imaging of grain orientation and microstructure. The direct visualization of three-dimensional grain orientation has opened up new dimensions for the characterization of polycrystalline materials, such as metal alloys, geological materials, ceramics, or pharmaceuticals.

LabDCT Pro supports samples ranging from cubic symmetric crystal structures to low symmetry systems such as monoclinic materials.

Collect high-resolution crystal information using a dedicated 4X DCT objective lens. For larger samples, use a flat panel detector (FPX) for large-area high-efficiency surface distribution imaging.

Conduct comprehensive three-dimensional microstructure analysis on larger representative volumes and various sample geometries.

Using four-dimensional imaging experiments to study microstructural evolution.

Combine three-dimensional crystal information with three-dimensional microstructural features.

Combining multiple modes to understand the structure attribute relationship.

　　Going further in terms of lining

The Dual Scan Contrast Visualization System (DSCoVer) is unique to the VersaXRM 730, which expands the details captured in a single energy absorption image by combining information from tomographic images taken at two different X-ray energies. DSCoVer (Dual Scan Contrast Visualization System) fully utilizes the interaction between X-rays and the effective atomic number and density in materials, providing you with better discrimination ability. For example, it can identify mineral differences within rocks, distinguish difficult to identify material differences such as silicon and aluminum.

　　Realize new degrees of freedom

The flagship product VersaXRM 730 offers additional features and imaging capabilities.

Using advanced acquisition techniques such as high aspect ratio tomography imaging (HART) to improve scanning speed and accuracy for large volume, flat, or irregular samples.

The use of Wide Field Mode (WFM) for flexible imaging of large samples can be used for lateral stitching of projection images to form a wider lateral observation field, providing higher voxel density for a given observation field, or providing a wide lateral observation field and larger three-dimensional volume for large samples.

Automatic Filter Converter (AFC) achieves seamless filter conversion without manual intervention and programs and records your choices for each formula.